Seagate Technology: Problem not solved yet but I've been understood...
A Seagate Technology customer review by GetHuman user ~Anonymous from November 19th, 2017
Background on ~Anonymous's case
GetHuman: ~Anonymous - can you tell our other Seagate Technology customers when your case took place?
~Anonymous: Yup. It was middle of the night, on November 18th.
GetHuman: Did you reach out to Seagate Technology, and if so, how?
GetHuman: And which of these common Seagate Technology customer issues best describes the reason you wanted to talk to them?
(Shows ~Anonymous a list of common Seagate Technology problems)
~Anonymous: "Returns" was why I was trying to call.
~Anonymous's review of Seagate Technology customer service
GetHuman: So how would you sum up your experience for GetHuman's Seagate Technology customer community? We'll censor any IDs, numbers, or codes and any inappropriate words here out of respect to the millions of other customers using this resource.
~Anonymous: Problem not solved yet but I've been understood and have been given instructions on what to do next. Fingers crossed....
GetHuman: Let's quantify your experience contacting Seagate Technology. On a scale of 1 to 5, how easy is it go get help on a Seagate Technology problem?
~Anonymous: I'd give them a four out of five for ease of finding your way to help.
GetHuman: What about quality of communication. How would you rate that on a 1 to 5 scale?
~Anonymous: I'd give them a five out of five on communication.
GetHuman: And what about Seagate Technology's ability to quickly and effectively address your problem?
~Anonymous: For that I would say two out of five.
GetHuman: And finally- any advice for other Seagate Technology customers?
~Anonymous: Call them early in the day or late. Don't forget any personal or account information you might need for Seagate Technology to know who you are.
GetHuman: Well there you have it. Some useful feedback and words from ~Anonymous taken from his Seagate Technology customer service problem that occurred on November 18th, 2017.